{"id":1418,"date":"2025-09-11T05:29:00","date_gmt":"2025-09-11T05:29:00","guid":{"rendered":"https:\/\/weitai2.globaldeepsea.site\/product\/4-inch-high-purity-semi-insulating-hpsi-sic-double-side-polished-wafer-substrate\/"},"modified":"2026-04-29T15:33:38","modified_gmt":"2026-04-29T07:33:38","slug":"4-inch-high-purity-semi-insulating-hpsi-sic-double-side-polished-wafer-substrate","status":"publish","type":"product","link":"https:\/\/www.cn-semiconductorparts.com\/fr\/product\/4-inch-high-purity-semi-insulating-hpsi-sic-double-side-polished-wafer-substrate\/","title":{"rendered":"4 Inch High Purity Semi-Insulating HPSI SiC Double-side Polished Wafer Substrate"},"content":{"rendered":"<div class=\"fl-builder-content fl-builder-content-10063 fl-builder-content-primary fl-builder-global-templates-locked\" data-post-id=\"10063\">\n<div class=\"fl-row fl-row-full-width fl-row-bg-none fl-node-66bee98b76c57\" data-node=\"66bee98b76c57\">\n<div class=\"fl-row-content-wrap\">\n<div class=\"fl-row-content fl-row-full-width fl-node-content\">\n<div class=\"fl-col-group fl-node-66bee98b76c97\" data-node=\"66bee98b76c97\">\n<div class=\"fl-col fl-node-66bee98b76cd6\" data-node=\"66bee98b76cd6\" style=\"width: 100%;\">\n<div class=\"fl-col-content fl-node-content\">\n<div class=\"fl-module fl-module-rich-text fl-node-66bee98b76d14\" data-animation-delay=\"0.0\" data-node=\"66bee98b76d14\">\n<div class=\"fl-module-content fl-node-content\">\n<div class=\"fl-rich-text\">\n<p><span style=\"font-family: arial, helvetica, sans-serif; font-size: medium;\">Semicera&#8217;s 4 Inch High Purity Semi-Insulating (HPSI) SiC Double-side Polished Wafer Substrates are crafted to meet the exacting demands of the semiconductor industry. These substrates are designed with exceptional flatness and purity, offering an optimal platform for cutting-edge electronic devices.<\/span><\/p>\n<p><span style=\"font-family: arial, helvetica, sans-serif; font-size: medium;\">These HPSI SiC wafers are distinguished by their superior thermal conductivity and electrical insulation properties, making them an excellent choice for high-frequency and high-power applications. The double-side polishing process ensures minimal surface roughness, which is crucial for enhancing device performance and longevity.<\/span><\/p>\n<p><span style=\"font-family: arial, helvetica, sans-serif; font-size: medium;\">The high purity of Semicera\u2019s SiC wafers minimizes defects and impurities, leading to higher yield rates and device reliability. These substrates are suitable for a wide range of applications, including microwave devices, power electronics, and LED technologies, where precision and durability are essential.<\/span><\/p>\n<p><span style=\"font-family: arial, helvetica, sans-serif; font-size: medium;\">With a focus on innovation and quality, Semicera utilizes advanced manufacturing techniques to produce wafers that meet the stringent requirements of modern electronics. The double-sided polishing not only improves the mechanical strength but also facilitates better integration with other semiconductor materials.<\/span><\/p>\n<p><span style=\"font-family: arial, helvetica, sans-serif; font-size: medium;\">By choosing Semicera\u2019s 4 Inch High Purity Semi-Insulating HPSI SiC Double-side Polished Wafer Substrates, manufacturers can leverage the benefits of enhanced thermal management and electrical insulation, paving the way for the development of more efficient and powerful electronic devices. Semicera continues to lead the industry with its commitment to quality and technological advancement.<\/span><\/p>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"fl-col-group fl-node-66bee98b76d52\" data-node=\"66bee98b76d52\">\n<div class=\"fl-col fl-node-66bee98b76d91\" data-node=\"66bee98b76d91\" style=\"width: 100%;\">\n<div class=\"fl-col-content fl-node-content\">\n<div class=\"fl-module fl-module-rich-text fl-node-66bee98b76dcf\" data-animation-delay=\"0.0\" data-node=\"66bee98b76dcf\">\n<div class=\"fl-module-content fl-node-content\">\n<div class=\"fl-rich-text\">\n<table border=\"0\" cellspacing=\"0\">\n<tbody>\n<tr>\n<td>\n<p>Articles<\/p>\n<\/td>\n<td>\n<p>Production<\/p>\n<\/td>\n<td>\n<p>Recherche<\/p>\n<\/td>\n<td>\n<p>Factice<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Param\u00e8tres de cristal<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Polytype<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>4H<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Erreur d'orientation de la surface<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>4\u00b10.15\u00b0<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Param\u00e8tres \u00e9lectriques<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Dopant<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>azote de type N<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>R\u00e9sistivit\u00e9<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>0,015-0.025ohm \u00b7 cm<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Param\u00e8tres m\u00e9caniques<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Diam\u00e8tre<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>150,0 \u00b1 0,2 mm<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>\u00c9paisseur<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>350 \u00b1 25 \u00b5m<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Orientation plate primaire<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>[1-100]\u00b15\u00b0<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Longueur plate primaire<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>47,5 \u00b1 1,5 mm<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Plat secondaire<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Aucun<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>TTV<\/p>\n<\/td>\n<td>\n<p>\u22645 \u00b5m<\/p>\n<\/td>\n<td>\n<p>\u226410 \u00b5m<\/p>\n<\/td>\n<td>\n<p>\u226415 \u00b5m<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>LTV<\/p>\n<\/td>\n<td>\n<p>\u22643 \u03bcm (5 mm * 5 mm)<\/p>\n<\/td>\n<td>\n<p>\u22645 \u03bcm (5 mm * 5 mm)<\/p>\n<\/td>\n<td>\n<p>\u226410 \u03bcm (5 mm * 5 mm)<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Arc<\/p>\n<\/td>\n<td>\n<p>-15 \u03bcm ~ 15\u03bcm<\/p>\n<\/td>\n<td>\n<p>-35 \u03bcm ~ 35 \u03bcm<\/p>\n<\/td>\n<td>\n<p>-45 \u03bcm ~ 45 \u03bcm<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Cha\u00eene<\/p>\n<\/td>\n<td>\n<p>\u226435 \u00b5m<\/p>\n<\/td>\n<td>\n<p>\u226445 \u00b5m<\/p>\n<\/td>\n<td>\n<p>\u226455 \u00b5m<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Rugosit\u00e9 avant (si-face) (AFM)<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Ra\u22640,2 nm (5 \u03bcm * 5 \u03bcm)<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Structure<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Densit\u00e9 de micro-<\/p>\n<\/td>\n<td>\n<p>&lt;1 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>&lt;10 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>&lt;15 ea \/ cm2<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Impuret\u00e9s m\u00e9talliques<\/p>\n<\/td>\n<td colspan=\"2\">\n<p>\u22645E10atoms\/cm2<\/p>\n<\/td>\n<td>\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>BPB<\/p>\n<\/td>\n<td>\n<p>\u22641500 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>\u22643000 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>TSD<\/p>\n<\/td>\n<td>\n<p>\u2264500 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>\u22641000 ea \/ cm2<\/p>\n<\/td>\n<td>\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Qualit\u00e9 avant<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Devant<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Si<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Finition de surface<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>CMP SI-FACE<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Particules<\/p>\n<\/td>\n<td>\n<p>\u226460ea \/ plaquette (taille 0,3 \u03bcm)<\/p>\n<\/td>\n<td colspan=\"2\">\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Rayures<\/p>\n<\/td>\n<td>\n<p>\u22645EA \/ MM. Longueur cumulative \u2264 diam\u00e8tre<\/p>\n<\/td>\n<td>\n<p>Longueur cumulatif \u22642 * diam\u00e8tre<\/p>\n<\/td>\n<td>\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>PELLE \/ PEPES ORANGE \/ TAPPES \/ COMMENTS \/ CRESCHES \/ CONTAMINATION<\/p>\n<\/td>\n<td colspan=\"2\">\n<p>Aucun<\/p>\n<\/td>\n<td>\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Coups de bord \/ retraits \/ fracture \/ plaques hexagonales<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Aucun<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Zones de polytype<\/p>\n<\/td>\n<td>\n<p>Aucun<\/p>\n<\/td>\n<td>\n<p>Zone cumulative\u226420%<\/p>\n<\/td>\n<td>\n<p>Zone cumulative \u2264 30%<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Marquage laser avant<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Aucun<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Qualit\u00e9 du dos<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Finition arri\u00e8re<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>CMP C-FACE<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Rayures<\/p>\n<\/td>\n<td>\n<p>\u22645ea \/ mm, longueur cumulative\u22642 * diam\u00e8tre<\/p>\n<\/td>\n<td colspan=\"2\">\n<p>N \/ A<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>D\u00e9fauts arri\u00e8re (puces de bord \/ retraits)<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Aucun<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Rugosit\u00e9 du dos<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Ra\u22640,2 nm (5 \u03bcm * 5 \u03bcm)<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Marquage laser arri\u00e8re<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>1 mm (du bord sup\u00e9rieur)<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Bord<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Bord<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Chanfreiner<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">Conditionnement<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td>\n<p>Conditionnement<\/p>\n<\/td>\n<td colspan=\"3\">\n<p>Pr\u00e9par\u00e9 en \u00e9pi avec un emballage sous vide<\/p>\n<p>Emballage de cassette multi-wafer<\/p>\n<\/td>\n<\/tr>\n<tr>\n<td colspan=\"4\">\n<p style=\"text-align: center;\">*Remarques: \u00abNA\u00bb signifie qu'aucun \u00e9l\u00e9ment de demande non mentionn\u00e9 ne peut se r\u00e9f\u00e9rer au semi-std.<\/p>\n<\/td>\n<\/tr>\n<\/tbody>\n<\/table><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"fl-col-group fl-node-66bee98b76ed0\" data-node=\"66bee98b76ed0\">\n<div class=\"fl-col fl-node-66bee98b76f0d\" data-node=\"66bee98b76f0d\" style=\"width: 100%;\">\n<div class=\"fl-col-content fl-node-content\">\n<div class=\"fl-module fl-module-photo fl-node-66bee98b76f4b\" data-animation-delay=\"0.0\" data-node=\"66bee98b76f4b\">\n<div class=\"fl-module-content fl-node-content\">\n<div class=\"fl-photo fl-photo-align-center\" itemscope=\"\" itemtype=\"http:\/\/schema.org\/ImageObject\">\n<div class=\"fl-photo-content fl-photo-img-png\"> <img decoding=\"async\" alt=\"tech_1_2_size\" class=\"fl-photo-img wp-image-2173\" itemprop=\"image\" src=\"\/wp-content\/uploads\/2025\/09\/e3ee0b4147c636ee.webp\"> <\/img><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"fl-col-group fl-node-66bee98b76e0d\" data-node=\"66bee98b76e0d\">\n<div class=\"fl-col fl-node-66bee98b76e53\" data-node=\"66bee98b76e53\" style=\"width: 100%;\">\n<div class=\"fl-col-content fl-node-content\">\n<div class=\"fl-module fl-module-photo fl-node-66bee98b76e91\" data-animation-delay=\"0.0\" data-node=\"66bee98b76e91\">\n<div class=\"fl-module-content fl-node-content\">\n<div class=\"fl-photo fl-photo-align-center\" itemscope=\"\" itemtype=\"http:\/\/schema.org\/ImageObject\">\n<div class=\"fl-photo-content fl-photo-img-jpg\"> <img decoding=\"async\" alt=\"Wafers SIC\" class=\"fl-photo-img wp-image-2174\" itemprop=\"image\" src=\"\/wp-content\/uploads\/2025\/09\/4530d9462eb0bb0b.webp\"> <\/img><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/p><\/div>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>Semicera\u2019s 4 Inch High Purity Semi-Insulating (HPSI) SiC Double-side Polished Wafer Substrates are precision-engineered for superior electronic performance. These wafers provide excellent thermal conductivity and electrical insulation, ideal for advanced semiconductor applications. Trust Semicera for unparalleled quality and innovation in wafer technology.<\/p>","protected":false},"featured_media":747,"comment_status":"closed","ping_status":"open","template":"","meta":[],"product_brand":[],"product_cat":[35,26],"product_tag":[],"class_list":{"0":"post-1418","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-sic-substrate","7":"product_cat-wafer","9":"first","10":"instock","11":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/product\/1418","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/comments?post=1418"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/media\/747"}],"wp:attachment":[{"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/media?parent=1418"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/product_brand?post=1418"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/product_cat?post=1418"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/www.cn-semiconductorparts.com\/fr\/wp-json\/wp\/v2\/product_tag?post=1418"}],"curies":[{"name":"WP","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}